The Zyvex sProber™, part of the NanoWorks® Tools
product line, is designed and optimized to electrically probe
sub-100nm features on semiconductor devices.
The system consists of a state-of-the-art Zyvex Nanomanipulator,
a parametric analyzer, an advanced anti-contamination system,
and custom software to control and integrate each component.
The sProber is uniquely designed for the customer’s
existing Scanning Electron Microscope (SEM) or Focused Ion
Beam (FIB) System. The system is easily installable and removable
by the user allowing for optimum usage of their SEM/FIB.
The system has four positioners with 5 nm resolution of movement.
The user can manipulate the probes and positioners using a
high precision joystick. The software provides accurate control
by tuning the motors and joystick to each user’s preference.
The center stage moves independently of the probes in the
Z direction for higher throughput and easier operability.
The center stage and sample holder can also be designed to
integrate with the load lock if the SEM/FIB is equipped with
one.
An easy-to-use Windows based software platform seamlessly
integrates all of the components of the sProber. The software
also provides instant feedback to the user and a powerful
scripting engine.
The sProber’s electrical characterization system is
specifically designed for low-noise measurements. Our most
advanced anti-contamination system rigorously cleans the SEM/FIB,
enabling the user to achieve superior ohmic contact. The system
can be further upgraded with most of the available application
packages offered by Zyvex.
The sProber is a full-featured nanoprobing solution for semiconductor
or failure analysis lab customers on a tight budget who already
own an SEM or FIB system.
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